Abstract
High-pressure synthesis of a new SrSi2O5 phase was performed at 16 GPa and 900°C by using a Kawai-type multianvil apparatus. The powder X-ray diffraction pattern of the compound was analyzed by Rietveld refinement based on the structure of a high-pressure polymorph of BaGe2O5, BaGe2O5 III. The structure is orthorhombic with space group Cmca and cell parameters of a = 5.2389(1) Å, b = 9.2803(2) Å, c = 13.4406(1) Å, V=653.46(2) Å 3 (Z=8, ρcalc=4.549 g/cm3). The structure consists of layers containing SiO6 octahedra and SiO4 tetrahedra. In a unit layer, oxygen and strontium atoms are arranged in an approximation to hexagonal close-packing. The strontium atom is accommodated in a 12-coordinated site. Each SiO6 octahedron shares four corners with SiO4 tetrahedra and the other two corners with another SiO6 octahedra. The SiO6 octahedra are linked to each other to form SiO6 chains along the a-axis. This is the first known example of a silicate with a BaGe2O5 III-type structure.
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Acknowledgements
We thank Drs. Y. Inaguma, T. Katsumata and T. Kuribayashi for their helpful advises on Rietveld analysis, and also Dr. Chakhmouradian and an anonymous reviewer for constructive reviews. This study was supported in part by Grants-in-Aid from the Ministry of Education, Science and Culture, Japan, and Japan Society for the Promotion of Science.
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Kojitani, H., Kido, M. & Akaogi, M. Rietveld analysis of a new high-pressure strontium silicate SrSi2O5. Phys Chem Minerals 32, 290–294 (2005). https://doi.org/10.1007/s00269-005-0467-6
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DOI: https://doi.org/10.1007/s00269-005-0467-6