XPS depth profile of plasma-activated surface of beech wood (Fagus sylvatica) and its impact on polyvinyl acetate tensile shear bond strength
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High surface selectivity of atmospheric pressure plasma treatment was demonstrated experimentally by XPS depth profile measurement of plasma-activated beech wood. Wood surface activated by diffuse coplanar surface barrier discharge was sequentially sputtered by Ar+ ion beam followed by immediate XPS analysis of freshly uncovered surface. According to the assessment, less than 330 nm of sputtered material was sufficient for complete removal of all plasma-formed functional groups. For the sake of practical implications of minimal vertical extent of plasma-mediated changes, the character of tensile shear bond strength improvement of polyvinyl acetate adhesive was examined with respect to its specific mass. A constant additive character of plasma activation to the bond strength was observed within the examined range of adhesive-specific mass.
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