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Analytical and Bioanalytical Chemistry

, Volume 407, Issue 8, pp 2055–2062 | Cite as

A micropixelated ion-imaging detector for mass resolution enhancement of a QMS instrument

  • Sarfaraz U. A. H. Syed
  • Gert B. Eijkel
  • Simon Maher
  • Piet Kistemaker
  • Stephen Taylor
  • Ron M. A. HeerenEmail author
Research Paper
Part of the following topical collections:
  1. Mass Spectrometry Imaging

Abstract

An in-vacuum position-sensitive micropixelated detector (Timepix) is used to investigate the time-dependent spatial distribution of different charge state (and hence different mass-to-charge (m/z)) ions exiting an electrospray ionization (ESI)-based quadrupole mass spectrometer (QMS) instrument. Ion images obtained from the Timepix detector provide a detailed insight into the positions of stable and unstable ions of the mass peak as they exit the QMS. With the help of image processing algorithms and by selecting areas on the ion images where more stable ions impact the detector, an improvement in mass resolution by a factor of 5 was obtained for certain operating conditions. Moreover, our experimental approach of mass resolution enhancement was confirmed by in-house-developed novel QMS instrument simulation software. Utilizing the imaging-based mass resolution enhancement approach, the software predicts instrument mass resolution of ∼1,0000 for a single-filter QMS instrument with a 210-mm long mass filter and a low operating frequency (880 kHz) of the radio frequency (RF) voltage.

Keywords

Mass spectrometry Imaging Spectroscopy/instrumentation 

Notes

Acknowledgments

This work is part of the research program of the Foundation for Fundamental Research on Matter (FOM), which is part of the Netherlands Organisation for Scientific Research (NWO). The research is supported by the Comprehensive Analytical Science and Technology (COAST) foundation, which is the assigned program committee in the NWO Technology Area for Sustainable Chemistry (TASC) program. The authors acknowledge Ronald Buijs and Marc Duursma, of AMOLF for their contribution to the experiments.

Supplementary material

216_2014_8158_MOESM1_ESM.pdf (179 kb)
ESM 1 (PDF 179 kb)

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Copyright information

© Springer-Verlag Berlin Heidelberg 2014

Authors and Affiliations

  • Sarfaraz U. A. H. Syed
    • 1
  • Gert B. Eijkel
    • 1
  • Simon Maher
    • 2
  • Piet Kistemaker
    • 1
  • Stephen Taylor
    • 2
  • Ron M. A. Heeren
    • 1
    Email author
  1. 1.FOM Institute AMOLFAmsterdamThe Netherlands
  2. 2.Department of Electrical Engineering and ElectronicsUniversity of LiverpoolLiverpoolUK

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