TOF-SIMS investigations on weathered silver surfaces

Abstract

Silver-coated quartz crystal microbalance (QCM) disks were treated under different environmental conditions (including changes in parameters such as relative humidity (%RH) and SO₂/H₂S content) in atmospheres of synthetic air and pure N₂ for 24 h in a weathering chamber. The corroded surfaces were subjected to depth profiling by a time of flight (TOF) secondary ion mass spectrometry (SIMS) instrument, equipped with a Bi⁺ analysis gun and Cs⁺ sputter gun. The evaluation of the in-depth distribution of several elements and species provides evidence for the formation of a corrosion layer containing Ag₂SO₃, even in the absence of oxidizing agents, such as H₂O₂ or NO₂. Furthermore it could be elucidated that the thickness of the formed Ag₂SO₃ layer does not depend on the SO₂ concentration but rather on the humidity and oxygen content of the ambient atmosphere. In weathering experiments in atmospheres composed of synthetic air, humidity, and H₂S, the presence of different oxygen species (surface and bulk) and silver sulfide could be detected by TOF-SIMS depth profiling experiments. The obtained results for both acidifying gases are in good correlation with the corresponding tapping mode atomic force microscopy (TM-AFM) investigations and in situ QCM measurements.