An X-ray fluorescence method (XRF) is presented that allowed low detection limits (at the 0.1–23 ng mL−1 level) to be obtained for Cr, Mn, Fe, Ni, Zn, Sr, Pb, Bi and Br in water. The samples were prepared using a thin layer method. Trace elements were determined via the calibration curve and standard addition. Absorption effects and inhomogenities in prepared samples were checked for using the emission–transmission method and internal standards, respectively. The results from the XRF method were compared with the results from the inductively coupled plasma atomic emission spectrometry method.
WDXRF Water Thin sample Heavy metals E–T method
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