The Logarithmic Tail of Néel Walls

We study the multiscale problem of a parametrized planar 180° rotation of magnetization states in a thin ferromagnetic film. In an appropriate scaling and when the film thickness is comparable to the Bloch line width, the underlying variational principle has the form

where the reduced stray-field operator 𝒮 _Q approximates (−Δ)^1/2 as the quality factor Q tends to zero. We show that the associated Néel wall profile u exhibits a very long logarithmic tail. The proof relies on limiting elliptic regularity methods on the basis of the associated Euler-Lagrange equation and symmetrization arguments on the basis of the variational principle. Finally we study the renormalized limit behavior as Q tends to zero.