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Output voltage and conducted EMI-based open-circuit fault detection signatures in a single-phase packed U-cell inverter

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Abstract

The packed U-cell inverter is a new and promising multilevel topology that uses a reduced number of power semi-conductors as compared to similar multilevel topologies. Even though many control and modulation algorithms were developed in the research literature, the fault detection and isolation of this converter have not yet been addressed. This paper proposes a new open-circuit fault diagnosis method for a single-phase five-level Packed U-cell inverter (PUC) that makes use of two signatures. The first one is the modulated output voltage that enables the fault detection by verifying the existence of few particular voltage levels. Though this signature does not need a high processing effort to detect the fault, however, only two faulty active power devices can be isolated. Thereafter, a conducted EMI signature, along with the Maximal Overlap Discrete Wavelet Transform (MODWT), is used to isolate the faulty active power device among the remaining power semiconductors. Experimental results are given and discussed to prove that the proposed hybridization of the two signatures is useful for open-circuit fault detection and isolation in PUC inverter.

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Abari, I., Sleiman, M., Hamouda, M. et al. Output voltage and conducted EMI-based open-circuit fault detection signatures in a single-phase packed U-cell inverter. Electr Eng 105, 1141–1151 (2023). https://doi.org/10.1007/s00202-022-01721-2

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