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Virtual metrology for enabling zero-defect manufacturing: a review and prospects

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Abstract

The ultimate objective of “Zero-Defect Manufacturing,” as a new growth step of Industry 4.0, is to significantly increase product yield and eventually accomplish zero-defect. For product quality inspection, the production sector currently uses physical inspection, which is an offline destructive test with a high discovery cost. Virtual metrology (VM), as one of the key technological methods to increase product yield, can forecast product quality through production process data, transforming conventional offline and delayed quality sampling into online and real-time quality full inspection. The growth timeline, application areas, methods, and technologies of VM are examined horizontally and vertically along the timeline in this article. Finally, the future growth of VM is prospected, and a manufacturing industry product quality management system that integrates data preprocessing and visualization, VM, and quality tracing is proposed.

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Funding

This work is supported by the National Natural Science Foundation of China under grants 72171172 and 62088101; Shanghai Municipal Science and Technology, China Major Project under grant 2021SHZDZX0100; and Shanghai Municipal Commission of Science and Technology, China Project under grant 19511132101.

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Author notes

  1. Li Li and Qingyun Yu contributed equally to this work.

Authors and Affiliations

  1. College of Electronic and Information Engineering, Tongji University, Shanghai, 201804, China

    Yaxuan Zhang, Li Li & Qingyun Yu

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  2. Li Li
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  3. Qingyun Yu
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Contributions

All authors contributed to the study conception and design. Material preparation, data collection, and analysis were performed by YZ. Investigation and funding acquisition were performed by LL. Project administration and resource scheduling were performed by QY. The first draft of the manuscript was mostly written by YZ, and all authors commented on previous versions of the manuscript. All authors read and approved the final manuscript.

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Correspondence to Qingyun Yu.

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Zhang, Y., Li, L. & Yu, Q. Virtual metrology for enabling zero-defect manufacturing: a review and prospects. Int J Adv Manuf Technol 130, 3211–3227 (2024). https://doi.org/10.1007/s00170-023-12726-x

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