Abstract
In this paper, we present an improved one-step lookahead A* algorithm for the scheduling problem for parallel-mode cluster tools, where n wafer types are simultaneously processed on a cluster tool with m chambers. Specifically, we suggest a refined cost function, priority-based node selection, N-chamber cycle detection to identify deadlock situations, and a one-step lookahead method to reduce the number of unsafe states generated. Using numerical experiments, we show that the proposed algorithm leads to a significant reduction in the number of explored states and execution time necessary to find an optimal solution.
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Kim, H.H., Choi, J.Y. An efficient one-step lookahead A* algorithm for PM-CT scheduling problems. Int J Adv Manuf Technol 72, 1481–1489 (2014). https://doi.org/10.1007/s00170-014-5755-1
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DOI: https://doi.org/10.1007/s00170-014-5755-1