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Misalignment inspection of multilayer PCBs with an automated X-ray machine vision system

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Abstract

In recent times, multilayer printed circuit boards (PCBs) have been extensively applied in the electronics industry owing to their high capacities for complex and densely packed circuit layouts arranged in a limited space. The inspection of fabricated multilayer PCBs is thus important in order to ensure quality control and improve the fabrication process. In this paper, an automated X-ray machine vision system was developed exclusively for the inspection of the layer-to-layer misalignment of laminated multilayer PCBs. Based on a mechatronics system and X-ray image processing techniques, an automated misalignment inspection process was established. Experiments meant to inspect three critical layer-to-layer misalignment modes, expansion, contraction, and offset, found within ten-layer PCB samples, were conducted to test the feasibility of the developed machine inspection system. The experimental results show that the developed X-ray machine vision system, combined with the automated misalignment inspection process, was able to undertake misalignment inspection of certain multilayer PCBs.

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References

  1. Scarlett JA (ed) (1985) The multilayer printed circuit board handbook. Electrochemical Publications, Ayr, Scotland, pp 181–235; pp. 423–429

  2. Coombs CF Jr (1988) Printed circuits handbook—third edition. McGraw-Hill, New York, pp 31.1–34.18

    Google Scholar 

  3. DeGarmo EP, Black JT, Kohser RA (2003) Materials and processes in manufacturing—ninth edition (update edition). Wiley, Hoboken, New Jersey, pp 910–915

    Google Scholar 

  4. Wu WY, Wang MJJ, Liu CM (1996) Automated inspection of printed circuit boards through machine vision. Comput Ind 28(2):103–111

    Article  Google Scholar 

  5. Rau H, Wu CH (2005) Automatic optical inspection for detecting defects on printed circuit board inner layers. Int J Adv Manuf Technol 25(9–10):940–946

    Article  Google Scholar 

  6. Rankov V, Crispin AJ (2007) Automated inspection of PCB components using a genetic algorithm template-matching approach. Int J Adv Manuf Technol 35(3–4):293–300

    Google Scholar 

  7. Moganti M, Ercal F (1995) Automatic PCB inspection system. IEEE Potentials 14(3):6–10

    Article  Google Scholar 

  8. Chen YS, Wu CH, Hu WF (2006) An active contour algorithm for detecting the circular features in a PCB x-ray image. In Proceedings of the SPIE-IS&T 18th Annual Symposium of Electronic Imaging Science and Technology, Vol. 6070, pp. 224–231

  9. Hanke RF, Weiss T, Petsch N (1992) Automated 3D X-ray inspection of fine pitch PCB’s. In Proceedings of the 13th IEEE/CHMT International Electronics Manufacturing Technology Symposium, pp 187-190

  10. Neubauer C (1997) Intelligent X-ray inspection for quality control of solder joints. IEEE Trans Compon, Packag, Manuf Technol Part C 20(2):111–120

    Article  Google Scholar 

  11. Lehmann DK (2002) X-ray system for optimizing PCB inspection. Circuits Assembly 13(2):35–39

    Google Scholar 

  12. Manjeshwar PK, Craik J, Phadnis S, Srihari K (2006) Effectiveness study of an automated 3D laminography x-ray inspection system in a high-volume-low-mix SMT line. Int J Adv Manuf Technol 30(11–12):1191–1201

    Article  Google Scholar 

  13. Rooks SM, Benhabib B, Smith KC (1995) Development of an inspection process for ball-grid-array technology using scanned-beam X-ray laminography. IEEE Trans Compon Packag Manuf Technol Part A 18(4):851–861

    Article  Google Scholar 

  14. Sumimoto T, Maruyama T, Azuma Y, Goto S, Mondou M, Furukawa N, Okada S (2003) Development of image analysis for detection of defects of BGA by using X-ray images. In Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vol. 2, pp. 1131–1136

    Google Scholar 

  15. Tick T, Jantunen H (2008) An X-ray imaging based layer alignment and tape deformation inspection system for multilayer ceramic circuit boards. IEEE Trans Electron Packag Manuf 31(2):168–173

    Article  Google Scholar 

  16. Yayatech Corp., X-ray checker XC-25P. http://www.yayatech.com/index-en.asp

  17. Su JC, Tarng YS (2006) Measuring wear of the grinding wheel using machine vision. Int J Adv Manuf Technol 30(1):50–60

    Article  Google Scholar 

  18. National Instrument Corp. (2007) NI vision concepts manual. National Instrument Corp., Austin, Texas, pp. 3.1–3.18; pp. 8.1–8.15; pp. 9.1–9.31; pp 11.1–11.22

  19. Jain R, Kasturi R, Schunck B (1995) Machine vision. McGraw-Hill, New York, pp. 25–72; pp. 112–185; pp. 210–223; pp. 309–364

  20. Gonzalez RC, Woods RE (2002) Digital image processing—second edition. Prentice-Hall, Upper Saddle River, New Jersey, pp. 75–146; pp. 519–566; pp. 595–611

  21. Umbaugh SE (2005) Computer imaging: digital image analysis and processing. CRC Press, Boca Raton, Florida, pp 67–199; pp 341–480

  22. Su JC, Tarng YS (2008) Automated visual inspection for surface appearance defects of varistors using an adaptive neuro-fuzzy inference system. Int J Adv Manuf Technol 35(7–8):789–802

    Article  Google Scholar 

  23. Szeliski R (1994) Image mosaicing for tele-reality applications. In Proceedings of the 2nd IEEE Workshop on Applications of Computer Vision, pp 44-53

  24. Szeliski R (1996) Video mosaics for virtual environments. IEEE Comput Appl 16(2):22–30

    Article  Google Scholar 

  25. Bao P, Xu D (1999) Complex wavelet-based image mosaics using edge-preserving visual perception modeling. Comput Graph 23(3):309–321

    Article  Google Scholar 

  26. Zhao L, Yang YH (1999) Mosaic image method: a local and global method. Pattern Recognit 32(8):1421–1433

    Article  Google Scholar 

  27. Can A, Steward CV, Roysam B, Tanenbaum HL (2002) A feature-based technique for joint, linear estimation of high-order image-to-mosaic transformations: mosaicing the curved human retina. IEEE Trans Pattern Anal Mach Intell 24(3):412–419

    Article  Google Scholar 

  28. Tian GY, Gledhill D, Taylor D (2003) Comprehensive interest points based imaging mosaic. Pattern Recognit Lett 24(9–10):1171–1179

    MATH  Google Scholar 

  29. Kim DH, Yoon YI, Choi JS (2003) An efficient method to build panoramic image mosaics. Pattern Recognit Lett 24(14):2421–2429

    Article  MATH  Google Scholar 

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Authors and Affiliations

  1. Department of Mechanical Engineering, National Taiwan University of Science and Technology, Taipei, 10607, Taiwan

    Shui-Fa Chuang, Chih-Cheng Lin & Yeong-Shin Tarng

  2. Opto-Mechatronics Technology Center, National Taiwan University of Science and Technology, Taipei, 10607, Taiwan

    Wen-Tung Chang

Authors
  1. Shui-Fa Chuang
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  2. Wen-Tung Chang
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  3. Chih-Cheng Lin
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  4. Yeong-Shin Tarng
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Correspondence to Wen-Tung Chang.

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Chuang, SF., Chang, WT., Lin, CC. et al. Misalignment inspection of multilayer PCBs with an automated X-ray machine vision system. Int J Adv Manuf Technol 51, 995–1008 (2010). https://doi.org/10.1007/s00170-010-2664-9

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  • DOI: https://doi.org/10.1007/s00170-010-2664-9

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