SXC control chart

  • Zhang Wu
  • Ming Xie
  • Qingchuan Liu
  • Yu Zhang
Original article


This article proposes the SXC (sum of xs with curtailment) control chart. This chart is nearly as simple as the \(\overline{X}\) chart for the operators to understand and implement. Meanwhile, it is as effective as the CUSUM chart for detecting the process mean shifts. The SXC chart can be applied to random inspection, as well as its special cases, i.e. uniform and 100% inspections. It is found that the SXC chart can reduce the out-of-control average time to signal (ATS) by 74%, on average, over a wide range of mean shifts compared to the Shewhart \(\overline{X}\) chart.


Control chart Curtailment Quality control Statistical process control 


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  1. 1.
    Montgomery DC (2001) Introduction to statistical quality control. Wiley, SingaporeGoogle Scholar
  2. 2.
    Western Electric (1956) Statistical quality control handbook. Western Electric Corporation, IndianapolisGoogle Scholar
  3. 3.
    Keats JB, Miskulin JD (1995) Statistical process control scheme design. J Qual Technol 27:214−225Google Scholar
  4. 4.
    Wu Z, Spedding TA (2000) A synthetic control chart for detecting small shifts in the process mean. J QualTechnol 32:32−38Google Scholar
  5. 5.
    Page ES (1954) Continuous inspection schemes. Biometrics 41:100−114zbMATHMathSciNetGoogle Scholar
  6. 6.
    Roberts SW (1959) Control chart tests based on geometric moving averages. Technometrics 1:239−250CrossRefGoogle Scholar
  7. 7.
    Juran JM, Godfrey AB (1999) Juran’s quality handbook. McGraw-Hill, SingaporeGoogle Scholar
  8. 8.
    Crowder SV, Hawkins DM, Reynolds MR, Yashchin E (1997) Process control and statistical inference. J Qual Technol 29:134−139Google Scholar
  9. 9.
    Klein M (2000) Two alternatives to the Shewhart \(\overline{X}\) control chart. J Qual Technol 32:427−431Google Scholar
  10. 10.
    Duncan AJ (1986) Quality control and industrial statistics. Irwin, Burr Ridge ILGoogle Scholar
  11. 11.
    Reynolds MR, Stoumbos ZG (1999) A CUSUM chart for monitoring a proportion when inspecting continuously. J Qual Technol 31:87−108Google Scholar
  12. 12.
    Hawkins DM, Olwell DH (1998) Cumulative sum control charts and charting for quality improvement. Springer, Berlin Heidelberg New YorkGoogle Scholar
  13. 13.
    Reynolds MR Jr, Stoumbos ZG (2001) Monitoring the process mean and variance using individual observations and variable sampling intervals. J Qual Technol 33:181−205Google Scholar
  14. 14.
    Box GP, Coleman DE, Baxley RV (1997) A comparison of statistical process control and engineering process control. J Qual Technol 29:128−130Google Scholar

Copyright information

© Springer-Verlag London Limited 2006

Authors and Affiliations

  1. 1.School of Mechanical and Production EngineeringNanyang Technological UniversitySingaporeSingapore

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