Abstract
A synthetic control chart for monitoring the changes in the standard deviation of a normally distributed process is proposed in this paper. The synthetic chart consists of the sample range (R) chart and the conforming run-length (CRL) chart. The R chart can be viewed as a special case of the synthetic chart. The operation, design and performance of this chart are described. Average run- length comparisons between other procedures and the synthetic chart are presented. It indicates that the synthetic chart is a good alternative for monitoring process dispersion. The variable sampling interval (VSI) schemes, as an enhancement to the synthetic chart, are discussed to further improve the chart performance. An example is presented to illustrate the application of synthetic chart and its VSI scheme.
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References
Nelson LS (1990) Monitoring reduction in variation with a range chart. J Qual Technol 22:163–165
Lowry CA, Champ CW, Woodall WH (1995) The performance of control charts for monitoring process variation. Commun Stat Simul Comput 24:409–437
Page ES (1963) Controlling the standard deviation by CUSUM and warning lines. Technometrics 5:307–315
Alt FB (1984) Multivariate quality control. In: Kotz S, Johnson NL, Read CR (eds) The encyclopedia of statistical sciences. Wiley, New York, pp 110–122
Tuprah K, Ncube M (1987) A comparison of dispersion quality control charts. Sequential Anal 6:155–163
Crowder SV, Hamilton MD (1992) An EWMA for monitoring a process standard deviation. J Qual Technol 24:12–21
Chang TC, Gan FF (1994) Optimal designs of one-sided EWMA charts for monitoring a process variance. J Stat Comput Simul 49:33–48
Chang TC, Gan FF (1995) A cumulative sum control chart for monitoring process variance. J Qual Technol 27:109–119
Acosta-Mejia CA (1998) Monitoring reduction in variability with the range. IIE Trans 30:515–523
Srivastava MS (1997) CUSUM procedure for monitoring variability. Commun Stat Theory Methods 26:2905–2926
Acosta-Mejia CA, Pignatiello JJ Jr., Rao BV (1999) A comparison of control charting procedures for monitoring process dispersion. IIE Trans 31:569–579
Klein M (2000) Modified S-charts for controlling process variability. Commun Stat Simul Comput 29:919–940
Wu A, Spedding TA (2000) A synthetic control chart for detecting small shifts in the process mean. J Qual Technol 32:32–38
Calzada ME, Scariano SM (2001) The robustness of the synthetic control chart to non-normality. Commun Stat Simul Comput 30:311–326
Davis RB, Woodall WH (2002) Evaluating and improving the synthetic control chart. J Qual Technol 34:200–208
Pearson ES, Hartley HO (1942) The probability integral of the range in samples of n observations from a normal population. Biometrika 32:301–310
Bourke PD (1991) Detecting a shift in fraction nonconforming using run-length control charts with 100% inspection. J Qual Technol 23:225–238
Kaminsky FC, Benneyan JC, Davis RD (1992) Statistical control charts based on a geometric distribution. J Qual Technol 24:63–69
Xie M, Goh TN, Lu XS (1998) A comparative study of CCC and CUSUM charts. Qual Reliabil Eng Int 14:339–345
Wu Z, Yeo SH, Fan H( 2000) A comparative study of the CRL-type control charts. Qual Reliabil Eng Int 16:269–279
Yang Z, Xie M, Kuralmani V, Tsui KL (2002) On the performance of geometric charts with estimated control limits. J Qual Technol 34:448–458
Reynolds MR Jr., Amin RW, Arnold JC, Nachlas JA (1988) X̄ charts with variable sampling intervals. Technometrics 30:181–192
Runger GC, Pignatiello JJ Jr. (1991) Adaptive sampling for process control. J Qual Technol 23:135–155
Aparisi F, Haro CL (2001) Hotelling’s T2 control chart with variable sampling intervals. Int J Prod Res 39:3127–3140
Tagaras G (1998) A survey of recent developments in the design of adaptive control charts. J Qual Technol 30:212–231
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Chen, FL., Huang, HJ. A synthetic control chart for monitoring process dispersion with sample range. Int J Adv Manuf Technol 26, 842–851 (2005). https://doi.org/10.1007/s00170-003-2010-6
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DOI: https://doi.org/10.1007/s00170-003-2010-6