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C pm MPPAC for manufacturing quality control applied to precision voltage reference process

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Abstract

A multiprocess performance analysis chart (MPPAC), based on the process capability index C pm , called C pm MPPAC, is developed to analyse the manufacturing quality of a group of processes in a multiple process environment. The C pm MPPAC conveys critical information about multiple processes regarding the departure of the process and process variability on one single chart. Existing research on MPPAC has been restricted to obtaining quality information from one single sample of each process, ignoring sampling errors. The information provided from the existing MPPAC chart, therefore, is unreliable and misleading, resulting in incorrect decisions. In this paper, the natural estimator of C pm is considered based on multiple samples. Based on the natural estimator of C pm , sampling errors are considered by providing an explicit formula with Matlab to obtain the estimation accuracy of the C pm . The sampling accuracy of C pm is tablulated for sample size determination so that engineers/practitioners can use it for in-plant applications. An example of multiple PVR processes is presented to illustrate the applicability of C pm MPPAC for manufacturing quality control.

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References

  1. Kane VE (1986) Process capability indices. J Qual Tech 18(1):41–52

    Google Scholar 

  2. Hsiang TC, Taguchi G (1985) A tutorial on quality control and assurance—the Taguchi methods. ASA Annual Meeting, Las Vegas, Nevada, USA

  3. Chan LK, Cheng SW, Spiring FA (1988) A new measure of process capability: C pm . J Qual Tech 20:162–173

    Google Scholar 

  4. Ruczinski I (1996) The relation between C pm and the degree of inclusion. Doctoral dissertation, University of Würzburg, Würzburg, Germany

  5. Singhal SC (1990) A new chart for analyzing multiprocess performance. Qual Eng 2(4):379–390

    Google Scholar 

  6. Singhal SC (1991) Multiprocess performance analysis chart (MPPAC) with capability zones. Qual Eng 4(1):75–81

    Google Scholar 

  7. Pearn WL, Chen KS (1997) Multiprocess performance analysis: a case study. Qual Eng 10(1):1–8

    Google Scholar 

  8. Pearn WL, Ko CH, Wang KH (2002) A multiprocess performance analysis chart based on the incapability index C pp : an application to the chip resistors. Microelectron Reliab (in press)

    Google Scholar 

  9. Chen KS, Huang ML, Li RK (2001) Process capability analysis for an entire product. Int J Prod Res 39(17):4077–4087

    Article  Google Scholar 

  10. Kirmani SNU, Kocherlakota AK, Kocherlakota S (1991) Estimation of σ and the process capability index based on sub-samples. Commun St Th 20(1):275–291

    Google Scholar 

  11. Vännman K (1997) Distribution and moments in simplified form for a general class of capability indices. Commun St Th 26:159–179

    Google Scholar 

  12. Boyles RA (1991) The Taguchi capability index. J Qual Tech 23:17–26

    Google Scholar 

  13. Pearn WL, Kotz S, Johnson NL (1992) Distributional and inferential properties of process capability indices. J Qual Tech 24(4):216–231

    Google Scholar 

  14. Kotz S, Johnson NL (1993) Process capability indices. Chapman & Hall, London

  15. Vännman K, Kotz S (1995) A superstructure of capability indices—distributional properties and implications. Scand J Stat 22:477–491

    Google Scholar 

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Correspondence to W. L. Pearn.

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Pearn, W.L., Shu, M.H. & Hsu, B.M. C pm MPPAC for manufacturing quality control applied to precision voltage reference process. Int J Adv Manuf Technol 23, 712–719 (2004). https://doi.org/10.1007/s00170-003-1688-9

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  • DOI: https://doi.org/10.1007/s00170-003-1688-9

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