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Genetic mapping of a major gene in triticale conferring resistance to bacterial leaf streak

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Abstract

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A major gene conferring resistance to bacterial leaf streak was mapped to chromosome 5R in triticale.

Abstract

Bacterial leaf streak (BLS), caused by Xanthomonas translucens pv. undulosa (Xtu), is an important disease of wheat and triticale around the world. Although resistance to BLS is limited in wheat, several triticale accessions have high levels of resistance. To characterize the genetic basis of this resistance, we developed triticale mapping populations using a resistant accession (Siskiyou) and two susceptible accessions (UC38 and Villax St. Jose). Bulked segregant analysis in an F2 population derived from the cross of Siskiyou × UC38 led to the identification of a simple sequence repeat (SSR) marker (XSCM138) on chromosome 5R that co-segregated with the resistance gene. The cross of Siskiyou × Villax St. Jose was advanced into an F2:5 recombinant inbred line population and evaluated for BLS reaction. Genetic linkage maps on this population were assembled with markers generated using genotyping-by-sequencing as well as several SSR markers previously identified on 5R. Quantitative trait locus (QTL) mapping revealed a single major QTL on chromosome 5R, underlined by the same SSR marker as in the Siskiyou × UC38 population. The F1 hybrids of the two crosses were highly resistant to BLS, indicating that resistance is largely dominant. This work will facilitate introgression of this rye-derived BLS resistance gene into the wheat genome by molecular marker-mediated chromosome engineering.

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Abbreviations

BLS:

Bacterial leaf streak

BSA:

Bulked segregant analysis

GBS:

Genotyping-by-sequencing

LOD:

Log of odds ratio

QTL:

Quantitative trait locus

MIM:

Multiple interval mapping

RIL:

Recombinant inbred line

REMS:

Rye expressed microsatellite sites

SNP:

Single nucleotide polymorphism

SSD:

Single seed descent

SSR:

Simple sequence repeat

SCM:

Secale cereale microsatellite

Xtu :

Xanthomonas translucens pv. undulosa

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Acknowledgements

We thank Mr. Justin Hestead for technical support, Drs. Xiwen Cai and Tim Friesen for critical review of the manuscript, and Drs. Andreas Börner (Leibniz Institute of Plant Genetics and Crop Plant Research, Gatersleben, Germany) and Zengjun Qi (Nanjing Agricultural University, Nanjing, China) for providing the sequences of rye 5R SSR primers. This material is based upon work supported, in part, by the National Institute of Food and Agriculture, United States Department of Agriculture (USDA), under Hatch project number ND02224, the North Dakota Wheat Commission, and the US National Science Foundation research Grant 2012-1238189 (F.F.W).

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  1. Aimin Wen and Malini Jayawardana had equal contributions for this research.

Authors and Affiliations

  1. Department of Plant Pathology, North Dakota State University, Fargo, ND, USA

    Aimin Wen, Malini Jayawardana, Suraj Sapkota, Gongjun Shi & Zhaohui Liu

  2. Department of Plant Sciences, North Dakota State University, Fargo, ND, USA

    Jason Fiedler & Xuehui Li

  3. Department of Plant Pathology, Kansas State University, Manhattan, KS, USA

    Zhao Peng & Sanzhen Liu

  4. Department of Plant Pathology, University of Florida, Gainesville, FL, USA

    Zhao Peng & Frank F. White

  5. Plant Pathology and Plant-Microbe Biology Section, School of Integrative Plant Science, Cornell University, Ithaca, NY, USA

    Adam J. Bogdanove

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  1. Aimin Wen
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  2. Malini Jayawardana
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  4. Suraj Sapkota
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  6. Zhao Peng
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  10. Xuehui Li
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  11. Zhaohui Liu
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Correspondence to Xuehui Li or Zhaohui Liu.

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The authors declare no conflicts of interest for this article.

Ethical standards

All experiments complied with the ethical standards of the university.

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Communicated by Thomas Miedaner.

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Wen, A., Jayawardana, M., Fiedler, J. et al. Genetic mapping of a major gene in triticale conferring resistance to bacterial leaf streak. Theor Appl Genet 131, 649–658 (2018). https://doi.org/10.1007/s00122-017-3026-x

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