Abstract
A novel approach based on the FSMO (fractional sliding model observer) is proposed to address the problem of nonlinear fault diagnosis in analog circuits. First, the fractional transform is extensively analyzed to derive the kernel functions. Next, the kernel functions are calculated and input into the SMO (sliding model observer). Then, the fractional sliding surface data are used to construct the FSMO of the fault feature extraction model. By analyzing the fractional sliding surface data, the digital fault features are extracted and used in the nonlinear fault diagnosis of the analog circuit. Finally, the experiments demonstrate the availability of the proposed method.
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The datasets generated during and/or analyzed during the current study are available from the corresponding author on reasonable request.
References
Y. Ao, Y. Shi, W. Zhang et al., An approximate calculation of ration of normal variables and its application in analog circuit fault diagnosis. J. Electron Test 29, 555–565 (2013)
H. Badihi, Y. Zhang, H. Hong, Wind turbine fault diagnosis and fault-tolerant torque load control against actuator faults. IEEE Trans. Control Syst. Technol. 23(4), 1351–1372 (2015)
T.G. Burton, R.A. Goubran, F. Beaucoup, Nonlinear system identification using a subband adaptive Volterra filter. IEEE Trans. Instrum. Meas. 58(5), 1389–1397 (2009)
D. Camarena-Martinez, M. Valtierra- Rodriguez, A. Garcia-Perez, et al., Empirical mode decomposition and neural networks on FPGA for fault diagnosis in induction motors. Sci. World J., 908140 (2014)
X. Chen, X. Xu, A. Liu et al., The use of multivariate EMD and CCA for Denoising muscle Artifacts from few-channel EEG recordings. IEEE Trans. Instrum. Meas. 67(2), 359–370 (2018)
J.B. Cloete, T. Stander, D.N. Wilke, Parametric circuit fault diagnosis through oscillation-based testing in analogue circuits: statistical and deep learning approaches. IEEE Access 10, 15671–15680 (2022)
Y. Deng, G. Chai, Soft fault feature extraction in nonlinear Analog circuit fault diagnosis. Circuits Syst. Signal Process 35, 4220–4248 (2016)
Y. Deng, N. Liu, Soft fault diagnosis in analog circuits based on bispectral models. J. Electron Test 33(5), 543–557 (2017)
Y. Deng, Y. Shi, W. Zhang, Diagnosis of incipient faults in weak nonlinear analog circuits. Circuits Syst. Signal Proc. 5, 2151–2170 (2013)
Y. Deng, Y. Shi, W. Zhang, An approach to locate parametric faults in nonlinear analog circuits. IEEE Trans. Instrum. Meas. 61(2), 358–367 (2012)
T. Gao, J. Yang, S. Jiang et al., A novel fault diagnosis method for analog circuits based on conditional variational neural networks. Circuits Syst. Signal Process 40(6), 2609–2633 (2021)
W. He, Y. He, B. Li, Generative adversarial networks with comprehensive wavelet feature for fault diagnosis of Analog circuits. IEEE Trans. Instrum. Meas. 69(9), 6640–6650 (2020)
W. He, Y. He, B. Li, C. Zhang, A Naive-bayes-based fault diagnosis approach for Analog circuit by using image-oriented feature extraction and selection technique. IEEE Access 8, 5065–5079 (2020)
W. He, Y. He, B. Li, C. Zhang, Analog circuit fault diagnosis via joint cross-wavelet singular entropy and parametrict-SNE. Entropy 20(8), 604–614 (2018)
N.E. Huang, S.R. Long et al., The empirical mode decomposition and the Hilbert spectrum for non-linear and non-stationary time series analysis. Proc. Roy. Soc. 454(1971), 903–995 (1998)
Z. Jia, Z. Liu, Y. Gan, C.M. Vong, M. Pecht, A deep forest-based fault diagnosis scheme for electronics-rich analog circuit systems. IEEE Trans. Industr. Electron. 68(10), 10087–10096 (2021)
R. Kodagunturi, E. Bradley, K. Maggard, C. Stroud, Bechmark circuits for analog and mixed-signal testing. Southeastcon’99 Proc of IEEE Kentuchy 217–220 (1999)
H. Li, H. Gao, P. Shi, Fault-tolerant control of Markovian jump stochastic systems via the augmented sliding mode observer approach. Automatica 50(7), 1825–1834 (2014)
H. Li, J. Wang, H.K. Lam, Q. Zhou, H. Du, Adaptive sliding mode control for interval type-2 fuzzy systems. IEEE Trans. Syst. Man Cybern. Syst. 46(12), 1654–1663 (2016)
M. Liu, P. Shi, L. Zhang, X. Zhao, Fault-tolerant control for nonlinear Markovian jump systems via proportional and derivative sliding mode observer technique. IEEE Trans. Circuits Syst. I Regul. Pap. 11, 2755–2764 (2011)
Y. Liu, Z. Wang, X. He et al., Filtering and fault detection for nonlinear systems with polynomial approximation. Automatica 54, 348–359 (2015)
H. Luo, W. Lu, Y. Wang et al., A new test point selection method for analog continuous parameter fault. J. Electron. Test. 33(3), 339–352 (2017)
Q. Ma, Y. He, F. Zhou et al., Test point selection method for analog circuit fault diagnosis based on similarity coefficient. Math. Probl. Eng. 2018(1), 9714206 (2018)
Y. Qin, X. Shi, L. Zhao, Two-channel CNN model for analog circuit fault diagnosis. Adv. Guid. 845, 2140–2150 (2023)
HG. Stratigopoulos, Machine learning support for diagnosis of analog circuits. machine learning support for fault diagnosis of system-on-chip (2023)
H. Tao, L. Cheng, J. Qiu, V. Stojanovic, Few shot cross equipment fault diagnosis method based on parameter optimization and feature mertic. Meas. Sci. Technol. 33, 115005 (2022)
H. Tao, J. Qiu, Y. Chen, V. Stojanovic, L. Cheng, Unsupervised cross-domain rolling bearing fault diagnosis based on time-frequency information fusion. J. Franklin Inst. 360, 1454–1477 (2023)
R. Valles-Novo, R.M.J. de Jesus, J.M. Ramirez-Cortes, H. Peregrina-Barreto, R. Morales-Caporal, Empirical mode decomposition analysis for broken-bar detection on squirrel cage induction motors. IEEE Trans. Instrum. Meas. 64(5), 1118–1128 (2014)
G.N. Watson, Notes on generating functions of polynomials: (2) hermite polynomials. J. Londn. Math. Soc. 1–8(3), 194–199 (1933)
C. Yang, Multiple soft fault diagnosis of analog filter circuit based on genetic algorithm. IEEE Access 8, 8193–8201 (2020)
H. Yang, C. Meng, C. Wang, Data-driven feature extraction for Analog circuit fault diagnosis using 1-D convolutional neural network. IEEE Access 8, 18305–18315 (2020)
Y. Yang, L. Wang, H. Chen et al., An end-to-end denoising Autoencoder-based deep neural network approach for fault diagnosis of Analog circuit. Analog Integr. Circ. Sig. Process 107(3), 605–616 (2021)
M. Zeller, W. Kellermann, Fast and robust adaptation of DFT-domain Volterra filters in diagonal coordinates using iterated coefficient updates. IEEE Trans. Signal Process. 58(3), 1589–1604 (2010)
K. Zhang, B. Jiang, X.G. Yan et al., Sliding mode observer based incipient sensor fault detection with application to high-speed railway traction device. ISA Trans. 63, 49–59 (2016)
Q. Zhang, X. Song, S. Song, V. Stojanovic, Finite-Time sliding mode control for singularly perturbed PDE systems. J. Franklin Inst. 360(2), 841–861 (2023)
X. Zhang, Sensor bias fault detection and isolation in a class of nonlinear uncertain systems using adaptive estimation. IEEE Trans. Autom. Control 56(5), 1220–1226 (2011)
G. Zhao, X. Liu, B. Zhang et al., A novel approach for analog circuit fault diagnosis based on deep belief network. Measurement 121, 170–178 (2018)
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Deng, Y., Zeng, X., Zhang, D. et al. Analog Circuit Fault Diagnosis Based on the Fractional Sliding Model Observer. Circuits Syst Signal Process 42, 6460–6480 (2023). https://doi.org/10.1007/s00034-023-02432-0
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DOI: https://doi.org/10.1007/s00034-023-02432-0