Abstract
— A general computer programme to compute the reflectance, transmittance, phase change on reflection and transmissin for normal or any oblique angle of incidence for any wavelength of any non-absorbing dielectric multilayer stack is worked out. The present programme also computes partial derivatives of reflectane with respect to the optical thickness of each layer for each wavelength.
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Apparao, K.V.S.R. Analysis of Optical Multilayer Thin-film Filters: A Guide To Thin-film Designer And Operator. J Opt 2, 47–52 (1973). https://doi.org/10.1007/BF03549741
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DOI: https://doi.org/10.1007/BF03549741