Abstract
Coarse grained high purity aluminum was tested in creep at temperatures of 400° to 1200°F to develop subgrain structures. Measurements of subgrain size, distribution, and rotation were made from X-ray diffraction patterns. Subgrain size and distribution were checked metallographically and the size was compared with average slip band spacing. The slip family was determined for several specimens.
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I. S. Servi, formerly Research Assistont, Massachusetts Institute of Technology
Discussion on this paper, TP 3345E, may be sent, 2 copies, to AIME by Dec. 1, 1952. Manuscript, March 24, 1952. Philadelphia Meeting, October 1952.
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Servi, I.S., Norton, J.T. & Grant, N.J. Some Observations of Subgrain Formation During Creep in High Purity Aluminum. JOM 4, 965–971 (1952). https://doi.org/10.1007/BF03397754
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DOI: https://doi.org/10.1007/BF03397754