Abstract
The influence of random microfields on measurements of external regular electric field by coherent nonlinear optics is analyzed. At an electron concentration <1014cm−3, the influence of microfields may be neglected. Possible separation of inputs from these microfields into the resulting signal is discussed.
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Ochkin, V.N., Savinov, S.Y. & Tskhai, S.N. Influence of Microfields on Coherent Optics Measurements of Electric Field Intensity. J Russ Laser Res 18, 582–590 (1997). https://doi.org/10.1007/BF03380176
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DOI: https://doi.org/10.1007/BF03380176