Abstract
There has been a revival in the field of imaging solid surfaces with forward scattered electrons using new transmission electron microscopes (TEMs). The availability of a better vacuum in the region of the specimen has made it feasible to study solid surfaces by imaging, diffraction and microanalytical techniques in the TEM. Some of the methods are TEM techniques which have been adapted to study bulk surfaces. The different techniques are at various stages of development, but they all possess potential with the advent of ultrahigh vacuum systems.
This is a preview of subscription content, log in via an institution to check access.
References
K. Takayanagi, “Surface Structure Imaging, by Electron Microscopy,” J. Microscopy, 136 (2) (1984), pp. 287–298.
C.J. Rossouw, S.E. Donnelly and D.F. Lynch, “Atomic Step Contrast from Forbidden Reflections,” Ultramicroscopy, 16 (1985), pp. 41–46.
J.M. Cowley and L. Peng, “The Image Contrast of Surface Steps in Reflection Electron Microscopy,” Ultramicroscopy, 16 (1985), pp. 59–68.
K. Takayanagi, Y. Tonishiro, S. Takahashi and M. Takahashi, “Structure Analysis, of Si(111)—7×7 Reconstructed Surface by Transmission Electron Diffraction,” Surface Science, 164 (1985), pp. 367–392.
D.J. Smith, “Atomic-Resolution Studies of Surface Dynamics by Electron Microscopy,” J. Vac. Sci. Technol., B3 (5) (1985), pp. 1563–1567.
J.L. Hutchison, “Surface Structures of Catalyst Particles Revealed by HREM,” Intermediate Voltage Microscopy and Its Application to Materials Science, ed. K. Rajan and P.B. Sewell (Mawah, N.J.: Electron Optics Pub. Group, Philips Electronics Instrumente Inc.) in press
T. Hsu, “A Laboratory Guide for Reflection Electron Microscopy,” Norelco Reporter, 31 (1), EM (1984), pp. 1–6.
T. Hsu, “Superlattice Image of Cleaved GaAs-Al.39Ga.61As by Electron Reflection Microscopy,” J. Vac. Sci. Tech., B3 (4) (1985), pp. 1035–1036.
O.L. Krivanek, Y. Tanishiro, K. Takayanagi and K. Yagi, “Electron Energy Loss Spectroscopy in Glancing Reflection from Bulk Crystals,” Ultramicroscopy, 11 (1983), pp. 215–222.
A. Howie and R.H. Milne, “Electron Energy Loss Spectra and Reflection Images from Surfaces,” J. Microscopy, 136 (2) (1984), pp. 279–285.
H. Ibach, “Elementary Surface Excitations and Electron Energy Loss Spectroscopy,” Ultramicroscopy, 11 (1983), pp. 179–186.
M.D. Shannon, J.A. Eades, M.E. Meichle and P.S. Turner, “Zone-Axis Patterns in Reflection High-Energy Electron Diffraction: A Family of New Techniques for Surface Characterization,” Ultramicroscopy, 16 (1985), pp. 175–192.
J.C. Barry, N. Long, A.K. Petford and D.J. Smith, “Imaging of Crystalline Defects and Surface at Atomic Resolution,” Intermediate Voltage Microscopy and Its Application to Material Science, eds. K. Rajan and P.B. Sewell (Mawah, N.J.: Electron Optics Pub. Group. Philips Electronics Inc.) in press.
Z.L. Kang, L. Eyring and D.J. Smith, Surface Science, in press.
Additional information
Krishna Rajan and Peter Sewell are currently with the Laboratory for Microstructural Sciences, Division of Physics, National Research Council of Canada, in Ottawa, Canada.
Rights and permissions
About this article
Cite this article
Rajan, K., Sewell, P. Surface Analysis in the TEM. JOM 38, 34–35 (1986). https://doi.org/10.1007/BF03258578
Published:
Issue Date:
DOI: https://doi.org/10.1007/BF03258578