Abstract
Computer-controlled scanning electron microscopy (CCSEM) is a technique that allows rapid, automated characterization of the size, shape and chemistry of large numbers of individual particles. When complemented with recently developed microimaging technology, CCSEM can store the location and characteristics of a specific particle for subsequent retrieval. The ability to detect particles and map their locations is especially useful when certain particles (impurities, for example) are sought.
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Additional information
A.J. Schwoeble is currently project manager of materials characterization at RJ Lee Group, Inc.
A.M. Dalley received her M.E. in metallurgy from Carnegie Mellon University in 1987. She is currently research metallurgist at RJ Lee Group, Inc. Ms. Dalley is als a member of TMS.
B.C. Henderson received his B.A. in biology from Indiana University of Pennsylvania in 1986. He is currently materials analyst at RJ Lee Group, Inc.
G.S. Casuccio received hs M.S. in physics from Drexel University in 1976. He is currently vice president and manager of materials characterization at RJ Lee Group, Inc.
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Schwoeble, A.J., Dalley, A.M., Henderson, B.C. et al. Computer-Controlled SEM and Microimaging of Fine Particles. JOM 40, 11–14 (1988). https://doi.org/10.1007/BF03258113
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DOI: https://doi.org/10.1007/BF03258113