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Computermodelle für Mikrowellenleistungstransistoren

Computer simulation for microware power transistors

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Zusammenfassung

Moderne Mobilfunksysteme, wie z. B. die dritte Generation von Mobiltelefonen (UMTS) oder der digitale Hörrundfunk (DAB), erfordern den Einsatz hochlinearer Sende-Endverstärker. Für den Entwurf derartiger Verstärker sind analytische Modelle der verwendeten Treiber- und Endstufentransistoren erforderlich, die das nichtlineare Großsignalverhalten möglichst präzise beschreiben. Im folgenden Beitrag wird gezeigt, wie ein auf Messungen der DC-Kennlinien und des Kleinsignalverhaltens beruhendes Modell zur Computersimulation des Großsignalverhaltens von Mikrowellenleistungstransistoren erstellt werden kann. Dabei wird besonders darauf eingegangen, welche Effekte das Modell für den Einsatz in der Entwicklung von Mobilfunksendeverstärkern wiedergeben muss.

Abstract

Coming cell phone systems like UMTS or digital audio broadcast (DAB) systems impose high demands on transmitter amplifier linearity. Analytical models of the microwave transistors used in the driver and power amplifier stages are necessary to describe the large signal behavior for design optimization. This paper shows how DC-IV and small signal measurements are used to generate a large signal model of microwave power transistors. Effects that have special influence on transmitter amplifiers will be emphasized.

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  1. Dambrine, Gilles, Cappy, Alain, Hildore, Frédéric, Playez, Edouard: A new method for determining the FET small-signal equivalent circuit. IEEE Transactions on Microwave Theory and Techniques, vol. 36 (1988), no. 7, S. 1151–1159.

    Article  Google Scholar 

  2. Golio, J. M. (editor), Arnold, E. N., Beckwith, W. B., Miller, M., Staudinger, J.: Microwave MESFETs & HEMTs. Artech House. 1991.

  3. Walker, J. L. B. (editor), Aoki, Y., Cooke, H. F., Culbertson, R. B., Hirano, Y., Lehmann, R. E., Pitzalis, O., Railton, G.: High Power GaAs FET Amplifiers. Artech House. 1993.

  4. Camacho-Penalosa, C., Aitchison, C. S.: Modelling frequency dependence of output impedance of a microwave MESFET at low frequencies. Electronic Letters, vol. 21 (1985), no. 12, S. 528–529.

    Google Scholar 

  5. Anholt, Robert: Electrical and thermal characterization of MESFETs, HEMTs, and HBTs. Artech House. 1995.

  6. Ladbrooke, Peter H.: MMIC Design. Artech House. 1989.

  7. Rodrigues, Paulo J. C.: Computer aided analysis of nonlinear microwave cicuits. Artech House. 1997.

  8. Brazil, T. J.: Nonlinear device modelling — constraints imposed by simulators. Proceedings of the 7th International Symposium on Recent Advances in Microwave Technology (ISRAMT-99), Malaga, Spain, Dec. 1999, S. 5–8.

  9. Snider, Arthur David: Charge conservation and the transcapacitance element: an exposition. IEEE Transactions on Education, vol. 38 (1995), Nov., S. 376–379.

    Article  Google Scholar 

  10. Cojocaru, Vicentiu I., Brazil, Thomas J.: A scalable general-purpose model for microwave FETs including DC/AC dispersion effects. IEEE Transactions on Microwave Theory and Techniques, vol. 45 (1997), no. 12, S. 2248–2255.

    Article  Google Scholar 

  11. Lee, Kang W., Lee, Kwyro, Shur, Michael S., Vu, Tho T., Roberts, Peter C. T., Helix, Max J.: Source, drain and gate series resistances and electron saturation velocity in ion-implanted GaAs FETs. IEEE Transactions on Electron Devices, vol. ED-32 (1985), no. 5, S. 987–992.

    Article  Google Scholar 

  12. Yang, Long, Long, Stephen I.: New method to measure the source and drain resistance of the GaAs MESFET. IEEE Electron Device Letters, vol. EDL-7 (1986), Feb., S. 75–77.

    Article  Google Scholar 

  13. Debie, P., Martens, L.: Fast and accurate extraction of parasitic resistances for nonlinear GaAs MESFET device models. IEEE Transactions on Electron Devices, vol. 42 (1995), no. 12, S. 2239–2242.

    Article  Google Scholar 

  14. Tayrani, R., Gerber, J. E., Daniel, T., Pengelly, R. S., Rhode, U. L.: A new and reliable direct parasitic extraction method for MESFETs and HEMTs. 23rd European Microwave Conference Proceedings, Sept. 1993, Madrid, Spain, S. 451–453.

  15. Cojocaru, Vicentiu I., Brazil, Thomas J.: Parasitic resistance extraction errors with implications for FET model accuracy around Vds=0. IEEE MTT-S International Microwave Symposium Digest, vol. 3 (1997), Jun., S. 1599–1602.

    Google Scholar 

  16. Berroth, M., Bosch, R.: Broad-band determination of the FET small-signal equivalent circuit. IEEE Transactions on Microwave Theory and Techniques, vol. 38 (1990), no. 7, S. 891–895.

    Article  Google Scholar 

  17. Angelov, Iltcho, Zirath, Herbert, Rorsman, Niklas: A new empirical nonlinear model for HEMT and MESFET devices. IEEE Transactions on Microwave Theory and Techniques, vol. 40 (1992), no. 12, S. 2258–2266.

    Article  Google Scholar 

  18. Angelov, Iltcho, Bengtsson, Lars, Garcia, Mikael: Extensions of the chalmers nonlinear HEMT and MESFET model. IEEE Transactions on Microwave Theory and Techniques, vol. 44 (1996), no. 10, S. 1664–1674.

    Article  Google Scholar 

  19. Parker, Anthony Edward, Skellern, David James: A realistic large-signal MESFET model for SPICE. IEEE Transactions on Microwave Theory and Techniques, vol. 45 (1997), no. 9, S. 1563–1571.

    Article  Google Scholar 

  20. Cojocaru, V. I., Brazil, T. J.: Improved prediction of the intermodulation distortion characteristics of MESFETs and PHEMTs via a robust nonlinear device model. IEEE MTT-S International Microwave Symposium Digest, vol. 2, June 1998, S. 749–752.

    Google Scholar 

  21. Marsetz, W., Hulsmann, A., Kleindienst, T., Fischer, S., Demmler, M., Bronner, W., Fink, T., Kohler, K., Schlechtweg, M.: High performance double recessed Al/sub 0.2/Ga/sub 0.8/As/In/sub 0.25/Ga/sub 0.75/As PHEMTs for microwave power applications. 27th European Microwave Conference Proceedings, 1997, S. 1030–1034.

  22. Cojocaru, V. I., Brazil, T. J.: Modelling the gate capacitances of MESFETs and HEMTs from low-frequency C-V measurements. 23rd European Microwave Conference Proceedings, Sept. 1993, S. 511–514.

  23. Scott, J., Rathmell, J. G., Parker, A., Sayed, M.: Pulsed device measurements and applications. IEEE Transactions on Microwave Theory and Techniques, vol. 44 (1996), no. 12, S. 2718–2723.

    Article  Google Scholar 

  24. Teyssier, J.-P., Bouysse, P., Ouarch, Z., Barataud, D., Peyretaillade, T., Quere, R.: 40-GHz/150-ns versatile pulsed measurement system for microwave transistor isothermal characterization. IEEE Transactions on Microwave Theory and Techniques, vol. 46 (1998), no. 12, S. 2043–2052.

    Article  Google Scholar 

  25. Verspecht, J., Schreurs, D.: Measuring transistor dynamic load lines and breakdown currents under large-signal high-frequency operating conditions. IEEE MTT-S International Microwave Symposium Digest, vol. 3, June 1998, S. 1495–1498.

    Google Scholar 

  26. Barataud, D., Arnaud, C., Thibaud, B., Campovecchio, M., Nebus, J. M., Vilotte, J. P.: Measurements of timedomain voltage/current waveforms at RF and microwave frequencies based on the use of a vector network analyzer for the characterization of nonlinear devicesapplication to high-efficiency power amplifiers and frequency-multipliers optimization. IEEE Transaction on Instrumentation and Measurement, vol. 47 (1998), Oct., S. 1259–1264.

    Article  Google Scholar 

  27. Ouarch, Z., Collantes, J. M., Teyssier, J. P., Quere, R.: Measurement based nonlinear electrothermal modeling of GaAs FET with dynamical trapping effects. IEEE MTT-S International Microwave Symposium Digest, vol. 2, June 1998, S. 599–602.

    Google Scholar 

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Smely, D., Cojocaru, V., Brazil, T.J. et al. Computermodelle für Mikrowellenleistungstransistoren. Elektrotech. Inftech. 117, 736–743 (2000). https://doi.org/10.1007/BF03157746

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