Abstract
The electrical resistivity of thin bismuth films, thermally evaporated onto freshly cleaved mica and glass substrates has been studied. Measurements were carried out in a wide range of temperatures and thicknesses. The data measured for thicker films were fitted to aFuchs-Sondheimer model withp=0, while the abrupt rise of resistivity for very thin films is described assuming a tunnelling mechanism for island film.
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Abou El Ela, A.H., Mahmoud, S. & Mahmoud, M.A. Electrical conduction of thin bismuth films. Acta Physica 52, 143–151 (1982). https://doi.org/10.1007/BF03155864
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DOI: https://doi.org/10.1007/BF03155864