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Effect of scattered photons on the intensities of X-ray characteristic lines

  • Atomic and Molecular Physics
  • Published:
Acta Physica Hungarica

Abstract

Enhancement effect of scattered photons on line intensities in isotope-radiation induced X-ray emission analysis was studied. Enhancement factors were determined by measurements performed with thin Ca, Cd, Co, Sr and Cs coatings on the surface of graphite and plastic matrices of varying thickness. The results were compared to data obtained by Monte Carlo simulation. A modified version of the simulation yielded to enhancement factors for elements distributed homogeneously in light matrices.

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Authors and Affiliations

  1. Institute of Radiochemistry and Physics, University of Chemical Engineering, 8201, Veszprém, Hungary

    L. Méray & E. Házi

Authors
  1. L. Méray
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  2. E. Házi
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Méray, L., Házi, E. Effect of scattered photons on the intensities of X-ray characteristic lines. Acta Physica Hungarica 63, 171–176 (1988). https://doi.org/10.1007/BF03155770

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  • DOI: https://doi.org/10.1007/BF03155770

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