Abstract
The value (τ2) and the intensity (I2) of the delayed component in the lifetime spectra of positrons annihilating in annealed and quenched teflon and in sulphur and crystex (polymer sulphur), at room temperature and at 77° K are reported. These data and the X-ray diffraction patterns for these materials are discussed in terms of the free volume model for the formation and quenching of positronium atoms in molecular materials.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Lagu, R. G., Kulkarni, V. G., Thosar, B. V. and Girish ChandraProc. Ind. Acad. Sci., 1969,69, 48.
Goldanskii, V. I. ..Positron Annihilation, Academic Press, 1967, p. 183.
Kulkarni, V. G., Lagu, R. G., Thosar, B. V. and Girish ChandraProc. Ind. Acad. Sci., 1969,70, 107.
Thosar, B. V., Kulkarni, V. G., Lagu, R. G. and Girish ChandraPhys. Letters, 1969,28 A, 760.
Girish Chandra, Kulkarni, V. G., Lagu, R. G. and Thosar, B. V.Phys. Letters, 1965,19, 201;Positron Annihilation, Academic Press, 1967, p. 335.
Wilson, R. K., Johnson, P. O. and Stump, R.Phys. Rev., 1963,129, 2091.
Tobolsky, A. V. ..J. Poly. Sci., 1966,12, Part C, 71.
Bell, R. E. and Graham, R. L.Phys. Rev., 1953,90, 644.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Kulkarni, V.G., Lagu, R.G., Chandra, G. et al. Positron annihilation in annealed and quenched teflon and in sulphur. Proc. Indian Acad. Sci. 72, 88–93 (1970). https://doi.org/10.1007/BF03050409
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF03050409