SEM studies on the leaf surface of promising mulberry (Morus spp.) genotypes

Abstract

Mulberry (Moms spp.) leaf quality has a great role in silkworm rearing which in turn affects the overall silk yield. In the recent past, many varieties of mulberry have been evolved considering the morphological characters, growth, yield, and quality parameters based on bioassay. The present investigation was carried out on ten promising mulberry genotypesviz. Tr-10, K-2, S-36, S-54, S-1, V-1, Mysore local, S-13, S-34, and RFS-135 to characterize stomatal size and frequency, trichomes and idioblasts using SEM. These new parameters will provide useful information for cultivars identification as well as for selecting mulberry genotypes adapted to different eco-climatic conditions and assessing the feeding quality of leaf for silkworm rearing.

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Correspondence to B. K. Singhal or V. Kumar or M. V. Rajan.

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Singhal, B.K., Kumar, V. & Rajan, M.V. SEM studies on the leaf surface of promising mulberry (Morus spp.) genotypes. J. Plant Biol. 42, 71–74 (1999). https://doi.org/10.1007/BF03031149

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Keywords

  • SEM
  • leaf surface
  • promising genotypes
  • Morus spp