Skip to main content
SpringerLink
Log in

Optical and electrical properties of amorphous thin films in Gex Te1-x system

  • Published:
Metals and Materials Aims and scope Submit manuscript

Abstract

GexTe1-x thin films of different compositions are prepared on glass substrates by sputtering deposition. The optical transmittance, reflectance, electrical resistivity of the thin films axe measured as a function of composition,x. The optical energy gap and the electrical resistivity is highest when GexTe1-x enters the GeTe2 phase due to its very ordered network structure resulting in narrow localized states in the amorphous energy band structure. Also, the refractive index and the extinction coefficient are lowest at the GeTe2 composition since the absorption tailing near the band edge is minimum.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Y. Hamakawa,Amorphous Semiconductor Technologies and Devices, North-Holand, Amsterdam (1981).

    Google Scholar 

  2. P. J. S. Ewen and A. E. Owen, inHigh-Performance Glasses (eds., M. Cable and J. M. Parker), p. 287, Chapman and Hill, New York (1992).

    Google Scholar 

  3. S. R. Elliott, inGlasses and Amorphous Materials (eds., R. W. Cahn, P. Haasen, E. J. Kramer), p. 375, VCH, Weinheim (1991).

    Google Scholar 

  4. K. Shimakawa,J. Non-Cryst. Solids 43, 229 (1981).

    Article  ADS  CAS  Google Scholar 

  5. M. Okuda, H. Naito and T. Matsushita,Jpn. J. Appl. Phys. 31, 466 (1992).

    Article  ADS  CAS  Google Scholar 

  6. J. M. Yanez-Limon, J. Gonzalez-Hemandez, J. J. Alvardo-Gil, I. Delgadillo and H. Vargas,Phys. Rev. B 52, 51 (1995).

    Article  Google Scholar 

  7. M. Libera and M. Chen,MRS Bulletin 4, 40 (1990).

    Google Scholar 

  8. K. A. Rubin,J. Magn. Soc. Jpn. 15, 127 (1991).

    Google Scholar 

  9. N. Yamada,MRS Bulletin 9, 48 (1996).

    Google Scholar 

  10. M. Chen, K. A. Rubin and Barton,Appl. Phys. Lett. 49, 502 (1986).

    Article  ADS  CAS  Google Scholar 

  11. K. L. Chopra and S. K. Bahl,J. Appl. Phys. 40, 4171 (1969).

    Article  ADS  CAS  Google Scholar 

  12. S. K. Bahl and K. L. Chopra,J. Appl. Phys. 40, 4940 (1969).

    Article  ADS  CAS  Google Scholar 

  13. S. K. Bahl and K. L. Chopra,J. Appl. Phys. 41, 2196 (1970).

    Article  ADS  CAS  Google Scholar 

  14. F. P. Robert and N. W. Gerold,Modular Series on Solid State Devices, Vol. 1, Addison-Wesley (1989).

  15. J. Tauc,Optical Properties of Solids, North-Holland, Amsterdam (1970).

    Google Scholar 

  16. J. Tauc,Amorphous and Liquid Semiconductors, Plenum Press, London (1970).

    Google Scholar 

  17. E. A. Davis and N. F. Mott,Phil Mag. 22, 903 (1970).

    Article  ADS  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Laboratory of Optical Materials and Coating (LOMC) Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, 373-1 Gusong-dong, 305-701, Yusong-ku, Taejon, Korea

    Tae-Kyun Kim, Sang-Soo Han & Byeong-Soo Bae

Authors
  1. Tae-Kyun Kim
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Sang-Soo Han
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Byeong-Soo Bae
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kim, TK., Han, SS. & Bae, BS. Optical and electrical properties of amorphous thin films in Gex Te1-x system. Metals and Materials 5, 33–37 (1999). https://doi.org/10.1007/BF03026001

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF03026001

Key words

Search

Navigation