Skip to main content
SpringerLink
Log in

Orthogonal algorithm of logic probability and syndrome-testable analysis

  • Published:
Journal of Computer Science and Technology Aims and scope Submit manuscript

Abstract

A new method, orthogonal algorithm, is presented to compute the logic probabilities (i.e. signal probabilities) accurately. The transfer properties of logic probabilities are studied first, which are useful for the calculation of logic probability of the circuit with random independent inputs. Then the orthogonal algorithm is described to compute the logic probability of Boolean function realized by a combinational circuit. This algorithm can make Boolean function “ORTHOGONAL” so that the logic probabilities can be easily calculated by summing up the logic probabilities of all orthogonal terms of the Boolean function.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Savir J., G. S. Ditlow and P.H. Bardell, Random Pattern Testability,IEEE Trans. Comput., C-33:1(1984).

    Article  Google Scholar 

  2. Seth S.C., An exact Analysis for Efficient Computation of Random-Pattern Testability in Combinational Circuits. Symp. of 16th FTCS, 1986, 318–323.

  3. Krishnamurthy B. and R. Li-Cheng Sheng, A New Approach to the Use of Testability Analysis in Test Generation. Proc. IEEE Int. Test Conf., 1985, 769–778.

  4. Serra M. and J.G. Muzio. Testing Programmable Logic Arrays by Sum of Syndrome,IEEE Trans. Comput.,C-36(1987), 1097–1101.

    Article  MATH  Google Scholar 

  5. Bennetts R.G., Design of Testable Logic Circuits, Chapter 2, Addison-Wesley Publishing Company, 1984.

  6. Zheng C. and Zhang, K., Logic Probability Calculation and Applications, Symp. '89 JFTCS, Chongqing, China, Nov. 1989.

  7. Savir J., Syndrome-Testable Design of Combinational Circuits,IEEE Trans. Comput.,C-29:6(1980).

    Google Scholar 

  8. Markowsky G., Syndrome-Testability Can Be Achieved by Circuit Modification,IEEE Trans. Comput.,C-30:8(1981), 604–606.

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Xi'an Jiaotong University, Xi'an, China

    Zheng Chongxun & Zhang Kenong

Authors
  1. Zheng Chongxun
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Zhang Kenong
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Zheng, C., Zhang, K. Orthogonal algorithm of logic probability and syndrome-testable analysis. J. of Compt. Sci. & Technol. 5, 203–209 (1990). https://doi.org/10.1007/BF02943426

Download citation

  • Received:

  • Revised:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02943426

Keywords

Search

Navigation