Abstract
It is known that critical path test generation method is not a complete algorithm for combinational circuits with reconvergent-fanout. In order to make it a complete algorithm, we put forward a reconvergent-fanout-oriented technique, the principal critical path algorithm, propagating the critical value back to primary inputs along a single path, the principal critical path, and allowing multiple path sensitization if needed. Relationship among test patterns is also discussed to accelerate test generation.
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Zhou, Q., Wei, D. A complete critical path algorithm for test generation of combinational circuits. J. of Compt. Sci. & Technol. 6, 74–82 (1991). https://doi.org/10.1007/BF02943410
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DOI: https://doi.org/10.1007/BF02943410