Abstract
A new approach is presented for easily testable two-dimensional iterative arrays. It is an improvement on GI-testability (Group Identical testability) and is referred to as GID-testability (Group Identical and Different testability). In a GID-testable two-dimensional array, the primaryx andy outputs are organized into groups and every group has more than one output. This is similar to the GI-testable arrays. However, GID-testability not only ensures that identical test responses can be obtained from every output in the same group when an array is fault free, but also ensures that at least one output has different test responses (from the other outputs in a group) when a cell in the array is faulty. Therefore, all faults can be detected under the assumption of a single faulty cell model. It is proved that an arbitrary two-dimensional iterative array is GID-testable if sevenx-states and seveny-states are added to the original flow table of the basic cell of the array.
GID-testability simplifies the response verification of built-in-self-testing in a way similar to PI-and GI-testability[6–9]. Therefore, it is suitable for BIST design.
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Huang, W., Lombard, F. On GID-testable two-dimensional iterative arrays. J. of Compt. Sci. & Technol. 9, 27–36 (1994). https://doi.org/10.1007/BF02939484
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DOI: https://doi.org/10.1007/BF02939484