Skip to main content
SpringerLink
Log in

Optical near field scattered by surface defects: Two-dimensional numerical analysis

  • Regular Papers
  • Information Optics
  • Published:
Optical Review Aims and scope Submit manuscript

Abstract

Recently developed scanning near-field optical microscopy has drawn attention to the problem of describing the electromagnetic field in the close vicinity of a surface. In this work, we present a numerical simulation that solves rigorously the field equations for a dielectric-air-dielectric layer system with arbitrary one-dimensional structure at its interfaces. Our theory is applied to calculate the intensity of the near field transmitted at the center of the tip of a probe as it is moved at a constant height above a surface with two identical topographic defects. The effects on the optical image due to the separation of the objects, and the shape difference between the ridges and grooves are discussed. The resolution limit and the conditions for near field interaction are determined.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. For example, seeNear Field Optics, eds. D.W. Pohl and D.W. Courjon (Kluwer, Dordrecht, The Netherlands, 1993)

  2. D. Barchiesi and D. Van Labeke: Ultramicroscopy57 (1995) 196.

    Article  Google Scholar 

  3. M. Xiao, S. Bozhevolnyi and O. Keller: Appl. Phys. A62 (1996) 115.

    ADS  Google Scholar 

  4. S. Wang, M. Xiao and J. Siqueiros: J. Mod. Opt.43 (1996) 2119.

    ADS  Google Scholar 

  5. A. Madrazo and M. Nieto-Vesperinas: J. Opt. Soc. Am. A13 (1996) 785.

    Article  ADS  Google Scholar 

  6. R. Carminati and J.J. Greffet: J. Opt. Soc. Am. A12 (1996) 2716.

    ADS  Google Scholar 

  7. D. Van Labeke and D. Barchies: J. Opt. Soc. Am. A10 (1993) 2193.

    ADS  Google Scholar 

  8. R. Carminati and J.J. Greffet: Opt. Commun.116 (1995) 316.

    Article  ADS  Google Scholar 

  9. J.C. Weeber, F. de Fornel and J.P. Goudnonnet: J. Opt. Soc. Am. A13 (1996) 944.

    ADS  Google Scholar 

  10. S. Wang and P. Halevi: Phys. Rev. B47 (1993) 10815.

    Article  ADS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Instituto de Física, Universidad Nacional Autónoma de México, Apartado Postal 2681, 22800, Ensenada, Baja California, México

    Shu Wang & Mufei Xiao

Authors
  1. Shu Wang
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Mufei Xiao
    View author publications

    You can also search for this author in PubMed Google Scholar

Additional information

This paper was originally presented at the first Asia-Pacific Workshop on Near Field Optics, which was held on August 17 and 18, 1996 at Seoul Education and Culture Center, Seoul, Korea, organized by Condensed Matter Research Institute, Seoul National University.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Wang, S., Xiao, M. Optical near field scattered by surface defects: Two-dimensional numerical analysis. Optical Review 4, 228–231 (1997). https://doi.org/10.1007/BF02931686

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02931686

Key Words

Search

Navigation