Abstract
Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.
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Rajasree, K., Ravikumar, A.V., Radhakrishnan, P. et al. Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique. Bull. Mater. Sci. 15, 183–188 (1992). https://doi.org/10.1007/BF02927444
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DOI: https://doi.org/10.1007/BF02927444