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Existing length of precursor film on inclined solid substrate

  • Two-Phase Systems
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Abstract

The present authors carried out an experimental study with a special interest upon the dynamics of the fluid in the vicinity of the boundary line of three phases; solid-liquid-gas interface, which is so-called ‘contact line,’ and upon the dynamic behavior of the precursor film in front of the advancing contact line. The present system concerned is a tiny droplet of silicone oil traveling on the silicon wafer. Simultaneous observations of the moving droplet with a white light and of the fringe pattern by the interferometer revealed the existence of the precursor film. The precursor film was varying its profile as the droplet traveled on the inclined substrate. In the present study the effect of the static pressure due to the weight of the droplet itself upon the existing length of the precursor film is focused.

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Authors and Affiliations

  1. Graduate School, Tokyo University of Science, Noda, Chiba, Japan

    Kanji Hirose & Takumi Konisho

  2. Tokyo University of Science, 2641 Yamazaki, 278-8510, Noda, Chiba, Japan

    Ichiro Ueno

Authors
  1. Kanji Hirose
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  2. Takumi Konisho
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  3. Ichiro Ueno
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Corresponding author

Correspondence to Kanji Hirose.

Additional information

Paper was presented on the Second International Topical Team Workshop on TWO-PHASE SYSTEMS FOR GROUND AND SPACE APPLICATIONS October 26–28, 2007, Kyoto, Japan.

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Hirose, K., Konisho, T. & Ueno, I. Existing length of precursor film on inclined solid substrate. Microgravity Sci. Technol 19, 81–83 (2007). https://doi.org/10.1007/BF02915759

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  • DOI: https://doi.org/10.1007/BF02915759

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