Abstract
A computer algorithm has been developed for the rapid solution of Laue back reflection patterns of cubic structures. Reflections of planes having indices (333) and lower are indexed directly without the use of special charts, nets or tables. The computational scheme compares the angles associated with reflections from the X-ray patterns and the true interplanar angles which are calculated by the program. Any film-to-specimen distance may be used and the systematic errors associated with measurement of this distance are minimized to determine the best value.
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References
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Huang, W.H., Christensen, J.H. & Block, R.J. A computer technique for the solution of laue back reflection patterns of cubic crystals. Part I. Metall Trans 2, 1367–1370 (1971). https://doi.org/10.1007/BF02913361
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DOI: https://doi.org/10.1007/BF02913361