Abstract
The proposed method of spline wavelet overlapped peaks analysis is based on the model of wavelet multifrequency channel decomposition. If the suitable optimal wavelet basis and frequency scale value are selected, the useful information can be extracted from noised overlapped signal. Then, according to the linear relationship between individual components in blurred version, multiple linear regression in low frequency domain is employed to resolve highly overlapped peaks. The results show that even signal-to-noise (S/N) decreases to 0.2, relative errors of peak intensity are less than 12% and the sum of square deviations Q is less than 0.3.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Bos, M., Hoogendam, E., Wavelet transform for the evaluation of peak intensities in flow-injection analysis,Anal. Chim. Acta, 1992, 267:73.
Zou Xiaoyong, Mo Jinyuan, Spline wavelet analysis for voltammetric signals,Anal. Chim. Acta, 1997, 340:115.
Zou Xiaoyong, Mo Jinyuan, Spline wavelet multifillering analysis,Chinese Science Bulletin (in Chinese), 1997, 42(8):640.
Lu Xiaoquan, Mo Jinyuan, Spline wavelet multi-resolution analysis for high-noise digital signal processing in ultraviolet-visible spectrophotometry,Analyst, 1996, 121: 1019.
Bao Lunjun, Mo Jinyuan, The application in processing analytical chemistry signal of a cardinal spline approach to wavelets,Anal. Chan., 1997, 69: 3053.
Yu Ruqin,Introduction to Chemometrics (in Chinese), Changsha: Hunan Education Publishing House, 1991, 59–75.
Author information
Authors and Affiliations
About this article
Cite this article
Zou, X., Mo, J. Spline wavelet overlapped peaks analysis. Chin. Sci. Bull. 44, 901–904 (1999). https://doi.org/10.1007/BF02885060
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02885060