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Probability distributions of the fractional differences of the structure amplitudes and intensities of two related crystals

  • Crystallography
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Abstract

The probability distributions of the fractional intensities and amplitudes of x-ray reflections from a pair of imperfectly related structures are derived when both the structures satisfy the requirements of a given type of basic Wilson distribution. These two distributions are used to obtain theoretical expressions for 2 new fractional type ofR-indices which are expected to be useful in the final stages of refinement. The theoretical distributions are also used to deduce some theoretical distributions which are useful as tests for centrosymmetry via the random permutation method. The theoretical values of the relevant semi-cumulative functions are also tabulated.

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Authors and Affiliations

  1. Department of Crystallography and Biophysics, University of Madras, 600025, Madras

    V Parthasarathi & S Parthasarathy

Authors
  1. V Parthasarathi
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  2. S Parthasarathy
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Parthasarathi, V., Parthasarathy, S. Probability distributions of the fractional differences of the structure amplitudes and intensities of two related crystals. Pramana - J Phys 9, 61–69 (1977). https://doi.org/10.1007/BF02845931

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  • DOI: https://doi.org/10.1007/BF02845931

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