Abstract
The nature of the temperature dependence of luminescence intensity from Er+ ions in GaInAsP, Si, InP, GaAs, AlGaAs, ZnTe, as observed by Favennecet al [1] has been examined in terms of a double exponential model. The smaller activation energy is found to be 58–100 meV, characteristic of a localized energy barrier at the Er+ centre while the higher activation energy is approximately 0.8E g attributed to an Auger non-radiative process of carrier excitation into bands. This model has been found to describe the observed temperature dependences with reasonably good agreement.
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Chanda, B., Bose, D.N. Thermal quenching of luminescence in erbium doped semiconductors. Pramana - J Phys 48, 1145–1149 (1997). https://doi.org/10.1007/BF02845889
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DOI: https://doi.org/10.1007/BF02845889