Abstract
X-ray, electrical conductivity and reflectance studies of the system ZnMn2-2xNixTixO4 have been carried out. The system is tetragonal in the range 0 ≤x ≤ 0.25 and cubic in the range 0.5 ≤x ≤ 1. Electrical resistivity temperature behaviour obeys Wilson’s law for all the compounds and the thermoelectric coefficient values vary between 325 and-290 μV/K. The activation energy and pRT decrease gradually with increase in concentration of charge carriers atB-site except for ZnNiTiO4. Reflectance spectral studies indicate the presence of Ni2+ at the octahedral site.
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Mulla, B.A., Darshane, V.S. Structural, electrical and reflectance studies of the system ZnMn2-2xNixTixO4 . Proc. Indian Acad. Sci. (Chem. Sci.) 92, 139–145 (1983). https://doi.org/10.1007/BF02840723
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DOI: https://doi.org/10.1007/BF02840723