Abstract
The delay fault induced by cross-talk effect is one of the difficult problems in the fault diagnosis of digital circuit. An intelligent fault diagnosis based on IDDT testing and support vector machines (SVM) classifier was proposed in this paper. Firstly, the fault model induced by cross-talk effect and the IDDT testing method were analyzed, and then a delay fault localization method based on SVM was presented. The fault features of the sampled signals were extracted by wavelet packet decomposition and served as input parameters of SVM classifier to classify the different fault types. The simulation results illustrate that the method presented is accurate and effective, reaches a high diagnosis rate above 95%.
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Foundation item: Supported by the National Natural Science Foundation of China (60374008. 60501022)
Biography: WANG Youren (1963-), male, Professor, research direction: bio-inspired hardware, intelligent testing and self repairing of electronic equipments.
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Youren, W., Xiaogian, D., Jiang, C. et al. Testing cross-talk induced delay faults in digital circuit based on transient current analysis. Wuhan Univ. J. Nat. Sci. 11, 1445–1448 (2006). https://doi.org/10.1007/BF02831794
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DOI: https://doi.org/10.1007/BF02831794