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Study on sampling inspection scheme to digital products in GIS

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Geo-spatial Information Science

Abstract

Adopting a principle of “check-accept for the first rank, inspection for the second rank”, this paper briefly discusses the rationale of the sampling inspection and the sampling inspection schemes to digital products in GIS. The OC curve is drawn to explain the deficiency of the percent sampling inspection. Meanwhile, the method of One Time Limiting Quality of count selection is presented as the inspection scheme for production departments while the method of One Time After-inspection Mean Percent Defective Upper Limit of count selection is for acceptance departments.

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Author information

Authors and Affiliations

  1. Dept. of Surveying and Geoinformatics, Tongji University, 1239 Siping Road, 200092, Shanghai, China

    Liu Chun

Authors
  1. Liu Chun
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  2. Liu Dajie
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Corresponding author

Correspondence to Liu Chun.

Additional information

Project supported by the National Science Foundation of China (No 49671065)

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Cite this article

Chun, L., Dajie, L. Study on sampling inspection scheme to digital products in GIS. Geo-spat. Inf. Sci. 4, 62–67 (2001). https://doi.org/10.1007/BF02826639

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  • DOI: https://doi.org/10.1007/BF02826639

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