Abstract
Liquidus isotherms for the Hg1−xCdxTe primary phase field in the Te-rich corner of the Hg-Cd-Te ternary system have been determined for temperatures from 425 to 600‡C by a modified direct observational technique. These isotherms were used to help establish conditions for the open-tube liquid phase epitaxial growth of Hg1−xCdxTe layers on CdTe1−ySey substrates. Layers with x ranging from 0.1 to 0.8 have been grown from Te-rich HgCdTe solutions under flowing H2 by means of a horizontal slider technique that prevents loss of Hg from the solutions by evaporation. Growth temperatures and times of 450–550‡C and 0.25–10 min, respectively, have been used. The growth solution equilibration time is typically 1 h at 550‡C. Source wafers, supercooled solutions, and (111)-oriented substrates were employed in growing the highest quality layers, which were between 3 and 15 Μm thick. Electron microprobe analysis was used to determine x for the epitaxial layers, and the resulting data, along with the liquidus isotherms, were used to obtain solidus lines. In addition to EMP data, optical transmission results are given.
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This work was sponsored by the Department of the Air Force and the U. S. Army Research Office.
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Harman, T.C. Liquidus isotherms, solidus lines and LPE growth in the Te-rich corner of the Hg-Cd-Te system. J. Electron. Mater. 9, 945–961 (1980). https://doi.org/10.1007/BF02822728
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DOI: https://doi.org/10.1007/BF02822728