Abstract
A series of nominally undoped and Si-doped GaAs samples have been grown by molecular beam epitaxy (MBE) with Hall concentrations ranging from 1015 to 1019 cm−3 and mobilities measured at 77 and 300K by Hall-van der Pauw methods. Drift mobilities were calculated using the variational principle method and Hall scattering factors obtained from a relaxation-time approximation to permit cross-correlation of experimental data with drift or Hall mobilities and actual or Hall electron concentrations. At 77K, both high purity and heavily doped samples are well represented by either drift or Hall values since piezoelectric acoustic phonon scattering and strongly screened ionized impurity scattering hold the Hall factor close to unity in the respective regimes. Between n≊1015 and 1017 cm−3, where lightly screened ionized impority scattering predominates, Hall mobility overestimates drift mobility by up to 50 percent and Hall concentration similarly underestimates n. At 300K, polar optical phonons limit mobility and a Hall factor up to 1.4 is found in the lowest doped material, falling close to unity above about 1016 cm−3. Our calculation also agrees remarkably well with the Hall mobility of the highest purity MBE grown sample reported to date.
Similar content being viewed by others
References
C.M. Wolfe, G.E. Stillman and W.T. Lindley,J. Appl. Phys. 41, 3088 (1970).
W. Walukiewwicz, L. Lagowski, L. Jastrzebski, M. Lichtensteiger and H.C. Gatos,J. Appl. Phys. 50, 899 (1979).
D.L. Rode,Semiconductors and Semimetals, Vol. 10, eds. W.K. Willardson and A.L. Beer, Academic, New York, 1975).
D.A. Anderson, N. Apsley, P. Davies and P.L. Giles,J. Appl. Phys. 58, 3059 (1985).
D. Lancefield, A.R. Adams and M.A. Fisher,J. Appl. Phys. 62, 2342 (1987).
J.R. Lowney and H.S. Bennett,J. Appl. Phys. 69, 7102 (1991).
A. Chandra, C.E.C. Wood, D.W. Woodard and L.F. Eastman,Solid-State Electron. 22, 645 (1979).
S. Adachi,J. Appl. Phys. 58, R1 (1985).
V.W.L. Chin, T. Osotchan and T.L. Tansley,Solid-State Electron. 35, 1247 (1992).
T.F. Kuech, B.S. Meyerson and E. Veuhoff,Appl. Phys. Lett. 44, 986 (1984).
C.M. Wolfe, N. Holonyak and G.E. Stillman,Physical Properties of Semiconductors (Prentice Hall, Englewood Cliffs, 1989).
J. Vilms and J.P. Garrett,Solid-State Electron. 15, 443 (1972).
H. Poth, H. Bruch, M. Heyen and P. Balk,J. Appl. Phys. 49, 285 (1978).
M. Lundstrom,Fundamentals of Carrier Transport in Modular Series on Solid State Devices (Addison-Wesley, Reading, 1990).
C.R. Stanley, M.C. Holland, A.H. Kean, M.B. Stanaway, R.T. Grimes and J.M. Chamberlain,Appl. Phys. Lett. 58, 478 (1991).
J.S. Blakemore,J. Appl. Phys. 53, R123 (1982).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Chin, V.W.L., Osotchan, T., Vaughan, M.R. et al. Hall and drift mobilities in molecular beam epitaxial grown GaAs. J. Electron. Mater. 22, 1317–1321 (1993). https://doi.org/10.1007/BF02817693
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02817693