References
G. Majni andG. Ottaviani:Appl. Phys. Lett.,31, 125 (1977).
G. Majni andG. Ottaviani:J. Cryst. Growth,45, 132 (1978).
G. Majni, G. Ottaviani andR. Stuck:Thin Solid Films,55, 235 (1978).
G. Majni andG. Ottaviani:J. Cryst. Growth,46, 119 (1979).
I. V. Mitchell andW. W. Lennard: inIon Beam Surface Layer Analysis, edited byO. Meyer, G. Linker andF. KÄppeler, Vol.2 (New York, N. Y., 1976).
E. Gadioli, I. Iori, M. Mangialaio andG. Pappalardo:Nuovo Cimento,38, 1105 (1965).
C. F. Williamson, J. P. Boujot andJ. Picard: Report CEA-R 3042 (1966).
Author information
Authors and Affiliations
Additional information
Work supported by GNSM-CNR and performed at the Laboratori Nazionali INFN di Legnaro (Padova).
Rights and permissions
About this article
Cite this article
Battaglin, G., Mea, G.D. Nuclear microanalysis of aluminium impurities in silicon. Lett. Nuovo Cimento 27, 397–400 (1980). https://doi.org/10.1007/BF02817204
Received:
Published:
Issue Date:
DOI: https://doi.org/10.1007/BF02817204