Abstract
The present paper introduces an experimental method for measuring the width of illuminated and short-circuited Ni/a-Si:H Schottky barriers. The current-voltage curves for the Schottky barrier solar cells under an AM1 illumination of 100 mW/cm2 are calculated by using the parameters determined by experiments. The diffusion length of holes ina-Si:H obtained from the illuminatedI–V curve is consistent with the results measured by the author with the surface photovoltage method in 1983. The factors affecting the fill factor are analysed on the basis of the calculated results. A comparison of the calculated results to the experimental ones reveals that the very low fill factor of the solar cells measured is due to series and shunt resistances rather than the low diffusion length of the holes.
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References
M. H. Brodsky, Amorphous Semiconductors, Springer-Verlag, Berlin, 1979, chap. 10.
Y. Kuwano, S. Tsuda and M. Ohnishi,Jpn. J. Appl. Phys.,21 (1982), 235.
M. Konagai, H. Miyamoto and K. Takahashi,ibid.,,19 (1980), 1923.
Xu Le and Liu Qiyi,J. Electronics (China)1 (1984), 74.
A. Catalano et al., 16 th IEEE Photovoltaic Specialists Conf., San Diego, (1982).
A. R. Moore,J. Appl. Phys.,54 (1983), 222.
Xu Le, D. K. Reinhard and M. G. Thompson,IEEE Trans. on ED,ED-29 (1982), 1004.
R. C. Neville, Solar Energy Conversion: The Solar Cell, Elsevier Scientific Publishing Co. New York, 1978, p. 37.
F. S. Sinencio and R. Williams,J. Appl. Phys.,54 (1983), 2757.
R. S. Crandall, R. Williams and B. E. Tompkins,ibid.,,50 (1979) 5506.
J. Beichler, W. Fuhs, H. Mell and H. M. Welsch,J. Non-cryst. Solids, 35/36 (1980), 587.
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Le, X. TheI–V characteristic analysis of schottky amorphous silicon solar cells. J. of Electron.(China) 3, 140–147 (1986). https://doi.org/10.1007/BF02778931
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DOI: https://doi.org/10.1007/BF02778931