Abstract
A probe-hole field emission microscope system, controlled by the Apple II computer, has been developed and operated successfully for measuring the work function of a single crystal plane. The detection screen, the phototube and the amplifier are combined for measuring the probe-hole current. The combination is calibrated and the calibrated data are used in the computer program. The high voltage on the viewing screen is adjusted by using a D/A converter. The total current and the probe-hole current are acquired by using an A/D converter. A program in BASIC is used for processing all data and the Fowler-Nordheim plot parameters are given. Work functions of single crystal planes can then be calculated; as examples, the work functions on the clean W(100) and W(111) planes are measured to be 4.67 eV and 4.45 eV, respectively.
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Subject Support by the Natural Science Fund of China.
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Yunming, G., Haishan, Z. & Enqiu, Z. Probe-hole field emission microscope system controlled by computer. J. of Electron.(China) 9, 69–75 (1992). https://doi.org/10.1007/BF02778595
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DOI: https://doi.org/10.1007/BF02778595