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Conditions for the coincidence of the TFR, TRV and CE models

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Abstract

Bhattacharyya and Soejoeti (1989) put forward the tampered failure rate model (TFR Model) for step-stress Accelerated Life Tests(ALT). This paper studies the conditions for the coincidence of the TRV, TFR and CE models, gives the definitions of the coincidence, offers a proof of the necessary and sufficient condition for the coincidence of the TRV and TFR models in [1], and points out a mistake that appeared in the counterexample provided in [3].

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Authors and Affiliations

  1. College of Mathematical Sciences, Shanghai Normal University, 200234, Shanghai

    Ronghua Wang & Heliang Fei

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  1. Ronghua Wang
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  2. Heliang Fei
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Wang, R., Fei, H. Conditions for the coincidence of the TFR, TRV and CE models. Statistical Papers 45, 393–412 (2004). https://doi.org/10.1007/BF02777579

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  • DOI: https://doi.org/10.1007/BF02777579

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