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Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications

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Abstract

The performance of several designs of dielectric resonators used for microwave characterization of FITS films has been analyzed from the point of view of accuracy, sensitivity, and range. Designs discussed include Hakki-Coieman shielded types as well as open-ended resonators with sapphire, rutile and (ZrSn)TiO3 dielectrics. The best dielectric resonators have proved to have an uncertainty in surface resistance measurements only twice the uncertainty in theQ-factor. high sensitivity, and ability to measure a wide range of surface resistances. Hence the dielectric resonator technique can be considered as a standard for measurements of surface resistance of HTS films for wireless and PCS communication systems applications provided that adequate measurement procedures of theQ 0-factor are followed.

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Authors and Affiliations

  1. Department of Electrical and Computer Engineering, James Cook University of North Queensland, Q 4811, Townsville, Australia

    Janina Mazierska

  2. Ginzton Laboratory, Stanford University, Stanford, California, USA

    Janina Mazierska

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  1. Janina Mazierska
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Mazierska, J. Dielectric resonator as a possible standard for characterization of high temperature superconducting films for microwave applications. J Supercond 10, 73–84 (1997). https://doi.org/10.1007/BF02763176

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  • DOI: https://doi.org/10.1007/BF02763176

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