Abstract
Thin films of zirconia have been synthesized using reactive DC magnetron sputtering. It has been found that films with good optical constants, high refractive index (1·9 at 600 nm) and low extinction coefficient can be prepared at ambient temperatures. The optical constants and band gap and hence the composition are dependent on the deposition parameters such as target power, rate of deposition and oxygen background pressure. Thermal annealing of the films revealed that the films showed optical and crystalline inhomogeneity and also large variations in optical constants.
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Suhail, M.H., Krishna, M.G., Rao, G.M. et al. Synthesis and properties of zirconia thin films. Bull. Mater. Sci. 17, 855–862 (1994). https://doi.org/10.1007/BF02757563
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DOI: https://doi.org/10.1007/BF02757563