An atomic force microscope study of carbon onions and related nanoparticles

Abstract

Carbon onions are found along with carbon nanotubes and other carbon nanoparticles in the cathodic deposit in the arc-vaporization of graphite. Atomic force microscopy has been used to characterize these particles on the basis of their sizes and shapes. Onion-like particles have three-dimensional, near spherical structure and are distinct from two-dimensional graphitic particles. The spherical shape and height to diameter ratios obtained using atomic force microscope, afford a distinction between onion-like structures and other carbon nanoparticles.