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Development of a flat-field XUV spectrograph for laser plasma interaction studies

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Abstract

A flat-field grating XUV spectrograph has been set up for laser plasma interaction studies. It uses a variable groove-spacing concave grating in grazing incidence geometry and operates in the wavelength range of 25–290 Å. A brief description of the design principle, construction and operation is given. Variation of spectral resolution with respect to the position of detector plane is studied. A resolution of 0.2 Å (at λ=35.0 Å) observed from the emission spectrum of carbon plasma is in agreement with that expected from design considerations. The instrument facilitates recording of multiple spectra on a single film and can be coupled to a microchannel plate-CCD camera detection system for on-line monitoring and processing of the spectrum, and to an X-ray streak camera for temporally resolved spectral measurements.

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Authors and Affiliations

  1. Centre for Advanced Technology, 452 013, Indore, India

    A Chowdhury, R A Joshi, S R Kumbhare, P A Naik & P D Gupta

Authors
  1. A Chowdhury
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  2. R A Joshi
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  3. S R Kumbhare
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  4. P A Naik
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  5. P D Gupta
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Correspondence to A Chowdhury.

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Chowdhury, A., Joshi, R.A., Kumbhare, S.R. et al. Development of a flat-field XUV spectrograph for laser plasma interaction studies. Sadhana 24, 557–566 (1999). https://doi.org/10.1007/BF02745629

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  • DOI: https://doi.org/10.1007/BF02745629

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