Abstract
The structure of electroless thin films of Ni-P has been studied. The microstructure and the selected area diffraction pattern of the samples reveal that certain samples transform to crystalline Ni with P in solid solution by nucleation and growth, whereas others transform to crystalline state by growth alone. The former set of thin films having a P-content of 19–21 at.% is characterized as amorphous. Films with a P-content of 13–15 at.% fall in the latter category and are characterized as microcrystalline. Those with a P-content of 16–18 at.% contain both amorphous and microcrystalline regions.
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Tyagi, S.V.S., Tandon, V.K. & Ray, S. Electron microscopy study of chemically deposited Ni-P films. Bull. Mater. Sci. 8, 433–438 (1986). https://doi.org/10.1007/BF02744158
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DOI: https://doi.org/10.1007/BF02744158